Application of Spectroscopic Ellipsometry and Mueller.

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films.Ellipsometry measures the change of polarization upon reflection or transmission and compares it to a model. It can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity.

This thesis gives an account of the original research work which I have carried out as a PhD student since November, 2013 in the Quantum Sensors group at the School of Engineering, University of Glasgow. In course of pursuing my PhD research I have benefitted greatly from the guidance and the advice that I have received from various sources. At.

R.W. Collins, in Encyclopedia of Materials: Science and Technology, 2001. Ellipsometry is a materials evaluation technique that derives its name from the measurement of the ellipse of polarization generated when a polarized light beam reflects obliquely from the specular surface of a sample. The instrument that performs this measurement is called an ellipsometer.

The present chapter will introduce the reader to the concepts of ellipsometry focusing on the aspects essential to the understanding of the thesis. A good first encounter with the basics can be found in Spectroscopic Ellipsometry and Reflectometry: A Users Guide authored by H.G. Tompkins and W.A. McGahan (2). An excellent educational book with.

Electrochemical ellipsometry is employed to determine the real and imaginary parts of the refractive index and the thickness of thin films as functions of the potential applied to the electrode upon which the film is grown. The relatively recent advent of an analyser with no moving parts, the Stokesmeter, has removed previous time restraints and allows microsecond resolution. The Newcastle.

College, for helping me with ellipsometry measurements. Equally, the rest of my research group have all helped me in one way or another during my PhD, so my thanks for putting up with my chain-tea-drinking habits go to Dr Virendra Chauhan, Dr Stefan Schumann, Ian Hancox, Nicola Beaumont, Luke.

Chapter 1 introduces the reasons behind this study, the importance and applications of PCDTBT in organic electronic devices, thus the importance of understanding how confinement in thin films influences the crystallisation of this polymer which will have an impact on the electronic properties of the material. Chapter 2 describes the analytical techniques used (ellipsometry, atomic force.

Investigations of Ultrafast Electron and Spin Dynamics in Metals by Volodymyr Kruglyak Submitted to the University of Exeter as a thesis for the degree of Doctor of Philosophy in Physics, August 2004. This thesis is available for the library use on the understanding that it is copyright.

This tutorial provided by the J. A. Woollam is an introduction to ellipsometry for anyone interested in learning more about ellipsometry and its applications. This tutorial is written with the novice in mind, but experienced ellipsometry users will also benefit from the information presented in this discussion.

This thesis is based on work carried out during my three years as PhD student at the Faculty of Health Sciences, Aarhus University, 2005-2009. The experiments were conducted at the Orthopaedic Research Laboratory, Aarhus University Hospital, Interdisciplinary Nanoscience.

PhD Thesis Department of Chemistry University of Heidelberg Submitted by: M.Sc. Mohamed Eita born in Egypt (Gharbia) Defence on: 31.03.2008.